Photonic force microscope

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Photonic force microscopy (PFM) is an optical-tweezers-based microscopy technique. A small dielectric particle (20 nm to several micrometres) is held by a strongly focused laser beam.

Optical tweezers are scientific instruments that use a highly focused laser beam to provide an attractive or repulsive force, depending on the relative refractive index between particle and surrounding medium, to physically hold and move microscopic objects similar to tweezers. They are able to trap and manipulate small particles, typically order of micron in size, including dielectric and absorbing particles. Optical tweezers have been particularly successful in studying a variety of biological systems in recent years.

Dielectric electrically poorly conducting or non-conducting, non-metallic substance of which charge carriers are generally not free to move

A dielectric is an electrical insulator that can be polarized by an applied electric field. When a dielectric is placed in an electric field, electric charges do not flow through the material as they do in an electrical conductor but only slightly shift from their average equilibrium positions causing dielectric polarization. Because of dielectric polarization, positive charges are displaced in the direction of the field and negative charges shift in the opposite direction. This creates an internal electric field that reduces the overall field within the dielectric itself. If a dielectric is composed of weakly bonded molecules, those molecules not only become polarized, but also reorient so that their symmetry axes align to the field.

Micrometre one millionth of a metre

The micrometre or micrometer, also commonly known by the previous name micron, is an SI derived unit of length equalling 1×10−6 metre ; that is, one millionth of a metre.

The forward scattered light, i.e. the light whose orientation is slightly changed while passing through the particle, and unscattered light are collected by a lens and projected onto a Quadrant Photo-Diode (QPD), i.e. a Position sensitive device (PSD). These two components interfere in the detector and produce signals, which permit the detection of the bead's position in three dimensions. The precision is very good (as low as 0.1 nm) and the recording speed is very high (up to 1 MHz). Brownian motion deflects the bead from the resting position. A time sequence of measured positions allows one to derive the optical potential in which the particle is held.

A Position Sensitive Device and/or Position Sensitive Detector (PSD) is an optical position sensor (OPS), that can measure a position of a light spot in one or two-dimensions on a sensor surface.

The PFM is sensitive to the environment of the particle and has been used in a variety of different experiments that e.g. monitor space that can be filled by particles inside agarose or the fate of small latex beads captured by macrophages.

A similar concept of scanning a bead with and optical trap over a surface was invented in 1993 by Ghislain and W. W. Webb. The name of photonic force microscope was first used in 1997 by Ernst-Ludwig Florin, Arnd Pralle, J. Heinrich Hoerber and Ernst H.K. Stelzer during their stays at EMBL, when they developed 3D position detection and began using the Brownian motion as scanner.

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Commercial PFM system